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Smart yet flawed – The vulnerable IoT Devices |
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IoT is a global ecosystem of information and technologies connected to each other. With a heterogenous nature that can pose a challenge to many aspects of testing, the exponential increase in its usage across the world has created a huge pressure to ensure security is not breached. In this presentation, Vipin Jain will explain why the IoT devices are still considered vulnerable despite of companies spending billions of dollars on their security. He will talk about their vulnerability issues while pointing out to some possible solutions. In that sense, he will present a security test suite that caters both standard and context-based security testing, allowing various security test cases to be executed in their varied environment conditions which mimic the real environments where these devices operate. Vipin Jain Vipin Jain is a Sr. Tech Lead from Metacube Software in India, where he is involved in establishing quality control and heading their delivery operations. With an experience of 21 years in the IT Industry, this MCA Graduate from Rajasthan University has accumulated in all these years a deep knowledge in software projects, their methodologies and quality. Avid speaker, published researcher and writer about software engineering and web technologies, he has a proven record of implementing and refining test processes for various clients across the globe while also being part of the Review Committees of various international organizations.
In this presentation you will learn about the security risks of IoT Devices and some interesting ways to avoid them while testing. |
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